# Inventory

Check this page often as our inventory changes frequently. **Contact us** for pricing.

Item | Material | Description | Qty |
---|---|---|---|

UV Fused Silica Window | Corning 7980 0F | Diameter: 7.784", Thk: 1.535", both sides polished, 1/10λ 20/10 per side, Chamfer 0.020" Wedge <3min | 2 |

UV Fused Silica Window | UV Fused Silica JGS1 | Diameter: 0.500", Thk: 0.250", S1: 1/10λ, S2: 1/4λ, 20/10 per side, Chamfer 0.020" Wedge <3min | 50 |

Wedge | Ge | Diameter: 25.40mm +0.00mm -0.25mm; Angle with tolerance: 8 degree +/- 0.25 degree; Thin end: 1.02mm +/- 0.13mm; both sides polished: S/D:60-40; Flatness: 2-3λ@633nm; Bevel<0.25; Chips <0.35mm; CA>80%; not coated | 65 |

Wedge | ZnSe | Diameter: 25.40mm +0.00mm -0.25mm; Angle with tolerance: 8 degree +/- 0.25 degree; Thin end: 1.02mm +/- 0.13mm; both sides polished: S/D:60-40; Flatness: 2-3λ@633nm; Bevel<0.25; Chips <0.35mm; CA>80%; not coated | 25 |

Wedge | ZnS MS | Diameter: 25.40mm +0.00mm -0.25mm; Angle with tolerance: 8 degree +/- 0.25 degree; Thin end: 1.02mm +/- 0.13mm; both sides polished: S/D:60-40; Flatness: 2-3λ@633nm; Bevel<0.25; Chips <0.35mm; CA>80%; not coated | 31 |

Wedge | Si | 6 | |

Wedge | Sapphire | 1 | |

Wedge | BK7 | 39 | |

Wedge | CaF2 | 38 | |

Wedge | MgF2 | 25 | |

Witness Sample | Sapphire | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40; flatness: 2-3λ @633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 5 |

Witness Sample | ZnSe | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40; flatness: 2-3λ @633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 48 |

Witness Sample | ZnS MS | Diameter:25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40; flatness: 2-3λ @633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 45 |

Witness Sample | Ge | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40;flatness: 2-3λ @633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 10 |

Witness Sample | Si | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40;flatness:2-3λ@633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 0 |

Witness Sample | Fused Silica | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40;flatness:2-3λ@633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 28 |

Witness Sample | CaF2 | Diameter: 25.4mm +/-0.1mm X 1.0mm thk. +/-0.05mm both sides polished, S/D:60-40;flatness:2-3λ@633nm; Parallelism: 3min; Bevel<0.25; Chips <0.35mm: CA>90% | 50 |

Witness Sample | MgF2 | 50 |